Dhar, S. ; Nag, B. R. (1982) Typing a semiconductor with point contacts Review of Scientific Instruments, 53 (2). pp. 217-220. ISSN 0034-6748
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Official URL: http://rsi.aip.org/resource/1/rsinak/v53/i2/p217_s...
Related URL: http://dx.doi.org/10.1063/1.1136930
Abstract
The results of typing measurements of semiconductor samples using a metal-semiconductor point contact technique, under different experimental conditions, are presented. The information obtained from these experiments has been verified for correctness by using standard techniques. A circuit arrangement is described which can be attached to a conventional four-probe resistivity jig in order to extend the applicability of the latter for determination of the type of a sample along with its resistivity measurements.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 28594 |
| Deposited On: | 15 Dec 2010 11:50 |
| Last Modified: | 08 Jun 2011 07:30 |
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