Ogale, S. B. ; Ghaisas, S. V. ; Kanetkar, S. M. ; Bhide, V. G. (1985) Mossbauer spectroscopy of ion-bombarded material surfaces Proceedings of the Indian Academy of Sciences - Chemical Sciences, 95 (1-2). pp. 207-227. ISSN 0253-4134
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Official URL: http://www.ias.ac.in/j_archive/chemsci/95/1/207-22...
Related URL: http://dx.doi.org/10.1007/BF02839728
Abstract
Recent trends in the field of ion bombardment of material surfaces are reviewed with a brief discussion about the present understanding of the subject. The use of novel characterization concepts to explore the ion beam-induced phenomena is emphasized and in this context the importance of the technique of conversion electron Mossbauer spectroscopy (CEMS) is brought out. A number of specific examples of the use ofCEMS technique to studies on ion implantation, ion beam mixing and corrosion of ion-bombarded surfaces have been given.
Item Type: | Article |
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Source: | Copyright of this article belongs to Indian Academy of Sciences. |
Keywords: | Mossbauer Spectroscopy; Ion Bombardment; Ion Implantation; Material Surfaces |
ID Code: | 26933 |
Deposited On: | 08 Dec 2010 12:58 |
Last Modified: | 17 May 2016 10:13 |
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