Bhagwat, Sunita ; Yedave, S. N. ; Phase, D. M. ; Chaudhari, S. M. ; Kanetkar, S. M. ; Ogale, S. B. (1989) Ion-beam mixing at the Fe/SiO2 interface: a conversion-electron Mossbauer spectroscopy and x-ray-diffraction study Physical Review B, 40 (1). pp. 700-703. ISSN 0163-1829
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Official URL: http://prb.aps.org/abstract/PRB/v40/i1/p700_1
Related URL: http://dx.doi.org/10.1103/PhysRevB.40.700
Abstract
The effect of ion-beam-induced atomic mixing and subsequent thermal transformations at the Fe:SiO2 (single crystal) interface have been investigated by means of conversion-electron Mossbauer spectroscopy and small-angle x-ray-diffraction measurements. The ion-beam-mixed sample in the as-mixed state shows the presence of the Fe7SiO10 phase along with magnetic Fe-Si-O complexes. The mixed state undergoes structural modifications upon annealing at 450 °C for several hours leading to an increase in Fe3+-to-Fe2+ ratio. The as-deposited sandwich structure upon annealing at 450 °C leads to the formation of metal island structures.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Physical Society. |
| ID Code: | 26908 |
| Deposited On: | 08 Dec 2010 13:01 |
| Last Modified: | 11 Jun 2011 11:35 |
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