Randhawa, H. S. ; Malhotra, L. K. ; Chopra, K. L. (1978) EPR studies on amorphous Ge-Al and Ge-Cu films Journal of Applied Physics, 49 (7). pp. 4294-4295. ISSN 0021-8979
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Official URL: http://jap.aip.org/resource/1/japiau/v49/i7/p4294_...
Related URL: http://dx.doi.org/10.1063/1.325353
Abstract
Electron paramagnetic resonance in amorphous germanium (a-Ge) alloy films containing varying concentrations of Al and Cu has been studied. The concentration of free spins (dangling bonds) is found to decrease rapidly on alloying to less than 5× 1017/cm3 for about 8 at.% Al and 10 at.% Cu concentrations. The g factor and line shape remain unaffected on alloying. The linewidth, however, shows minor changes.
Item Type: | Article |
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Source: | Copyright of this article belongs to American Institute of Physics. |
ID Code: | 23177 |
Deposited On: | 25 Nov 2010 13:21 |
Last Modified: | 28 May 2011 09:00 |
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