Deposition of polymer bilayer configuration by pulsed laser ablation and its use for study of polymer-polymer interface

Abstract

Thin films of polyphenylene sulphide (PPS) and polyethylene (PE) polymers have been deposited in a bilayer configuration using pulsed excimer laser ablation. Such bilayer specimens have been annealed at different temperatures, up to a maximum of 120°C, and for different time intervals, up to a maximum of 110 min, to investigate the evolution of the interface. By employing the technique of spectroscopic ellipsometry, the nature and the degree of thermally induced polymeric transport across the interface are brought out.