Fang, K. T. ; Mukerjee, R. (2000) A connection between uniformity and aberration in regular fractions of two-level factorials Biometrika, 87 (1). pp. 193-198. ISSN 0006-3444
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Official URL: http://biomet.oxfordjournals.org/content/87/1/193....
Related URL: http://dx.doi.org/10.1093/biomet/87.1.193
Abstract
We show a link between the two apparently unrelated areas of uniformity and minimum aberration. With reference to regular fractions of two-level factorials, we derive an expression for the centred L2-discrepancy measure for uniformity in terms of the word-length pattern. This result indicates, in particular, excellent behaviour of minimum aberration designs with regard to uniformity and provides further justification for the popular criterion of minimum aberration.
Item Type: | Article |
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Source: | Copyright of this article belongs to Oxford University Press. |
Keywords: | Centred L2-discrepancy; Fractional Factorial Design; Minimum Aberration; Uniformity |
ID Code: | 20307 |
Deposited On: | 20 Nov 2010 14:42 |
Last Modified: | 07 Jun 2011 06:44 |
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