Soman, K. P. ; Misra, K. B. (1992) Moments of order statistics using the orthogonal inverse expansion method and its application in reliability Microelectronics Reliability, 32 (4). pp. 469-473. ISSN 0026-2714
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/002627...
Related URL: http://dx.doi.org/10.1016/0026-2714(92)90474-Y
Abstract
Moments of order statistics have widespread use in life-testing and reliability studies. The orthogonal inverse expansion method is a unique method which allows one to obtain moments and product moments of order statistics of any distribution. In the present paper, we demonstrate the application of the orthogonal inverse expansion method to compute moments of order statistics and the use of these moments in various reliability studies.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 20020 |
| Deposited On: | 20 Nov 2010 15:09 |
| Last Modified: | 07 Jun 2011 06:42 |
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