Excimer laser ablation processed ferroelectric and antiferroelectric thin films

Krupanidhi, S. B. ; Saha, S. ; Bhattacharyya, S. ; Bharadwaja, S. S. N. (2000) Excimer laser ablation processed ferroelectric and antiferroelectric thin films Integrated Ferroelectrics, 31 (1-4). pp. 1-12. ISSN 1058-4587

Full text not available from this repository.

Official URL: http://www.informaworld.com/smpp/content~db=all~co...

Related URL: http://dx.doi.org/10.1080/10584580008215635

Abstract

The dielectric and electrical properties of excimer laser ablated processed paraelectric (Ba0.5, Sr0.5)TiO3, ferroelectric Bi-layered SrBi2(Ta0.5Nb0.5)2O9, and antiferroelectric (PbZrO3) thin films have been investigated. The effect of processing parameters on the microstructure of the films and the functional properties has been presented in detail. Some of the recent studies of stress induced effects, dielectric, hysteresis and ac and dc electrical properties have been highlighted in conjunction with microstructures of the films.

Item Type:Article
Source:Copyright of this article belongs to Taylor and Francis Ltd.
Keywords:BST; SBNT; PZ Thin Films
ID Code:19432
Deposited On:22 Nov 2010 12:36
Last Modified:06 Jun 2011 09:34

Repository Staff Only: item control page