Krupanidhi, S. B. ; Saha, S. ; Bhattacharyya, S. ; Bharadwaja, S. S. N. (2000) Excimer laser ablation processed ferroelectric and antiferroelectric thin films Integrated Ferroelectrics, 31 (1-4). pp. 1-12. ISSN 1058-4587
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Official URL: http://www.informaworld.com/smpp/content~db=all~co...
Related URL: http://dx.doi.org/10.1080/10584580008215635
Abstract
The dielectric and electrical properties of excimer laser ablated processed paraelectric (Ba0.5, Sr0.5)TiO3, ferroelectric Bi-layered SrBi2(Ta0.5Nb0.5)2O9, and antiferroelectric (PbZrO3) thin films have been investigated. The effect of processing parameters on the microstructure of the films and the functional properties has been presented in detail. Some of the recent studies of stress induced effects, dielectric, hysteresis and ac and dc electrical properties have been highlighted in conjunction with microstructures of the films.
Item Type: | Article |
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Source: | Copyright of this article belongs to Taylor and Francis Ltd. |
Keywords: | BST; SBNT; PZ Thin Films |
ID Code: | 19432 |
Deposited On: | 22 Nov 2010 12:36 |
Last Modified: | 06 Jun 2011 09:34 |
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