Lele, S. (1980) X-ray diffraction from faulted close-packed structures. Analytic solution for integrated intensities Acta Crystallographica Section A: Foundations of Crystallography, 36 (4). pp. 584-588. ISSN 0108-7673
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Official URL: http://onlinelibrary.wiley.com/doi/10.1107/S056773...
Related URL: http://dx.doi.org/10.1107/S0567739480001258
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| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to International Union of Crystallography. |
| ID Code: | 19401 |
| Deposited On: | 22 Nov 2010 12:40 |
| Last Modified: | 06 Jun 2011 11:02 |
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