Role of template layer on microstructure, phase formation and polarization behavior of ferroelectric relaxor thin films

Abstract

(1-x)Pb(Mg_1/3Nb_2/3)O₃-(x)PbTiO₃ (PMNPT) a relaxor ferroelectric has gained attention due to its interesting physical properties both in the bulk and thin film forms from a technological and fundamental point of view. The PMNPT solid solution at the morphotropic phase boundary composition has superior properties and is potentially used as an electrostrictive actuator, sensor, and in MEMS applications. Deposition of phase pure PMNPT thin films on bare platinized silicon wafers has been an impossible task so far. In this study the role of the LSCO template on the phase formation and the influence of platinum surface on the same have been studied. It was observed that formation of hillocks in Pt coated silicon wafers is associated with an ATG type of instability while roughening through strain relaxation. The hillocks formation was observed only on the troughs of the strain waves on the surface of Pt. The nucleation and growth of the PMNPT films were analyzed using AFM studies and the nucleation nucleates only at the tips of the hillocks and grows along the same direction with a new nucleus adjacent to the first one. A wavy pattern of PMNPT nuclei was observed and later the lateral growth of the islands takes place to cover the surface and minimizes the roughness to 2 nm. Hence, a template layer with a minimum of 40 nm is required to have a complete coverage with a roughness of less than 2 nm. The chemical states of the PMNPT films grown with and without the template layer were analyzed using x-ray photoelectron spectrum. The XPS spectrum of PMNPT deposited on a Pt surface exhibited a reduced oxidation state of niobium ions and a metallic state of Pb at the initial stage of the growth, which effectively destabilizes the perovskite phase of PMNPT in which the charge states and the ordering of Nb and Mg are more crucial to have a stable perovskite structure.