Bharadwaja, S. S. N. ; Krupanidhi, S. B. (2001) Study of AC electrical properties in multigrain antiferroelectric lead zirconate thin films Thin Solid Films, 391 (1). pp. 126-132. ISSN 0040-6090
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/S00406...
Related URL: http://dx.doi.org/10.1016/S0040-6090(01)00911-7
Abstract
Antiferroelectric lead zirconate (PZ) thin films were deposited by excimer laser ablation technique on Pt-coated Si substrates. Antiferroelectric thin film compositions are potential candidates for high charge storage and microelectromechanical systems. The antiferroelectric nature in PZ thin films was confirmed by means of double hysteresis behaviour in polarisation vs. applied electric field and double butterfly response in capacitance vs. applied voltage measurements. The maximum spontaneous polarisation observed was 37 µ C/cm2 with zero remnant polarisation at an applied electric field of 225 kV/cm. PZ thin films showed a polycrystalline multigrain structure and detail comprehensive study of dielectric relaxation and ac electrical properties were carried out.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| Keywords: | Antiferroelectric PZ Thin Films; Laser Ablation; Dielectric Properties; Electrical Properties; Measurements |
| ID Code: | 19003 |
| Deposited On: | 25 Nov 2010 14:37 |
| Last Modified: | 06 Jun 2011 07:42 |
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