Udayakumar, K. R. ; Schuele, P. J. ; Chen, J. ; Krupanidhi, S. B. ; Cross, L. E. (1995) Thickness-dependent electrical characteristics of lead zirconate titanate thin films Journal of Applied Physics, 77 (8). pp. 3981-3986. ISSN 0021-8979
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Official URL: http://link.aip.org/link/?JAPIAU/77/3981/1
Related URL: http://dx.doi.org/10.1063/1.359508
Abstract
Ferroelectric lead zirconate titanate thin films of morphotropic phase boundary composition were fabricated through the sol-gel spin-on technique to study the thickness dependence of electrical characteristics. At saturation, the films exhibited a dielectric constant of 1300, dissipation factor of 0.03, Curie temperature of 366° C, remanent polarization of 36 µ C/cm2, coercivity of around 30 kV/cm, and dielectric breakdown strength of over 1 MV/cm. The temperature dependence of permittivity showed an anomalous behavior with annealing temperature. The high temperature dielectric behavior of the films were distinguished by smeared and stunted dielectric maximum.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 18757 |
| Deposited On: | 17 Nov 2010 12:27 |
| Last Modified: | 06 Jun 2011 10:44 |
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