Rai, Sanjay K. ; Kumar, Anish ; Shankar, Vani ; Jayakumar, T. ; Bhanu Sankara Rao, K. ; Baldev Raj, (2004) Characterization of microstructures in Inconel 625 using X-ray diffraction peak broadening and lattice parameter measurements Scripta Materialia, 51 (1). pp. 59-63. ISSN 1359-6462
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/S13596...
Related URL: http://dx.doi.org/10.1016/j.scriptamat.2004.03.017
Abstract
This study demonstrates that, three parameters which are microstrain, lattice parameter and crystallite size, obtained from X-ray diffraction line profile analysis, can be used in a complementary way to study the precipitation/dissolution of various intermetallics and carbides in nickel base superalloy Inconel 625, without extracting the precipitates from the matrix.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Acta Materialia Inc. |
| Keywords: | XRD; Inconel 625; Precipitation; Intermetallics |
| ID Code: | 18235 |
| Deposited On: | 17 Nov 2010 12:56 |
| Last Modified: | 13 May 2011 09:19 |
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