Krishnakumar, E. ; Nagesha, K. (1995) Dissociative attachment studies by negative-ion time-of-flight mass spectrometry Rapid Communications in Mass Spectrometry, 9 (4). pp. 336-343. ISSN 0951-4198
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Official URL: http://onlinelibrary.wiley.com/doi/10.1002/rcm.129...
Related URL: http://dx.doi.org/10.1002/rcm.1290090415
Abstract
Experiments using time-of-flight mass spectrometry for studying the formation of negative ions in dissociative attachment processes by electron impact are discussed. The problems of making accurate measurements of absolute partial cross-sections have been solved using a combination of a new pulsed-electron-beam/pulsed-ion-extraction technique, the relative flow technique and a time-of-flight mass spectrometer. We also discuss some of the results obtained utilizing this method.
Item Type: | Article |
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Source: | Copyright of this article belongs to John Wiley and Sons, Inc. |
ID Code: | 18081 |
Deposited On: | 17 Nov 2010 13:13 |
Last Modified: | 03 Jun 2011 12:26 |
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