Pandey, R. K. ; Rooz, A. J. N. ; Kulkarni, S. K. (1987) Auger electron spectroscopic investigations of the influence of deposition parameters on the stoichiometry of n-CdSe films electrodeposited from low purity materials Thin Solid Films, 150 (1). pp. 51-58. ISSN 0040-6090
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/004060...
Related URL: http://dx.doi.org/10.1016/0040-6090(87)90307-5
Abstract
The effects of deposition potential, annealing and the presence of a masking agent during film formation on the stoichiometry and purity of electrodeposited CdSe films were investigated using Auger microprobe analysis. The photoanodic behaviour of CdSe films in an aqueous electrolyte containing an S2--S22- redox couple was also studied and the results are correlated with the findings of Auger analysis.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 17997 |
| Deposited On: | 17 Nov 2010 13:22 |
| Last Modified: | 04 Jun 2011 09:11 |
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