Krishnan, R. ; Upadhyaya, D. D. (1985) Defect structure studies using positron annihilation spectroscopy Pramana - Journal of Physics, 24 (1-2). pp. 351-359. ISSN 0304-4289
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Official URL: http://www.ias.ac.in/j_archive/pramana/24/1-2/351-...
Related URL: http://dx.doi.org/10.1007/BF02894838
Abstract
The positron annihilation method is a new addition to the range of sensitive complementary nuclear techniques available for material's research. The preferential sensitivity of positrons towards micro-defect domains which are not assessable by other techniques makes it an attractive tool for many materials science problems. The present paper is intended as a brief introduction on the principle of measurements and its potential is exemplified with the help of results on some metallic and ceramic systems.
Item Type: | Article |
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Source: | Copyright of this article belongs to Indian Academy of Sciences. |
Keywords: | Defect Structure Studies; Positron Annihilation Spectroscopy; Sensitive Complementary Nuclear Techniques |
ID Code: | 17440 |
Deposited On: | 16 Nov 2010 13:05 |
Last Modified: | 17 May 2016 02:04 |
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