Pragasam, R. ; Srinivasan, C. ; Murthy, V. R. K. ; Viswanathan, B. ; Sobhanadri, J. ; Satyalakshmi, K. M. ; Hegde, M. S. (1993) Comparison of the effect of processing parameters and degradation on the DC and microwave properties of thin films and polycrystalline bulk high-Tc superconducting materials Superconductor Science and Technology, 6 (6). pp. 402-407. ISSN 0953-2048
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Official URL: http://iopscience.iop.org/0953-2048/6/6/003
Related URL: http://dx.doi.org/10.1088/0953-2048/6/6/003
Abstract
The sharp increase in microwave power loss (the reverse of what has previously been reported) at the transition temperature in high-Tc superconducting systems such as YBaCu oxide (polycrystalline bulk and thin films obtained by the laser ablation technique) and BiPbSrCaCu oxide is reported. The differences between DC resistivity ( rho ) and the microwave power loss (related to microwave surface resistance) are analysed from the data obtained by a simultaneous measurement set-up. The influence of various parameters, such as preparation conditions, thickness and aging of the sample and the probing frequency (6-18 GHz), on the variation of microwave power loss with temperature is outlined.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Institute of Physics Publishing. |
| ID Code: | 16523 |
| Deposited On: | 15 Nov 2010 09:29 |
| Last Modified: | 03 Jun 2011 08:48 |
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