Sarma, D. D. ; Santra, Pralay K. ; Mukherjee, Sumanta ; Nag, Angshuman (2013) X-ray Photoelectron Spectroscopy: A Unique Tool To Determine the Internal Heterostructure of Nanoparticles Chemistry of Materials, 25 (8). pp. 1222-1232. ISSN 0897-4756
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Official URL: https://doi.org/10.1021/cm303567d
Related URL: http://dx.doi.org/10.1021/cm303567d
Abstract
We review the existing literature on the application of X-ray photoelectron spectroscopy in the study of nanocrystals. The unique ability of this technique to provide quantitative and reliable descriptions of highly complex internal structures of a variety of nanocrystals has been discussed in detail. We show that an accurate description of the nanocrystal internal structure is crucial and a prerequisite to understand many different properties, particularly optical properties, of such nanocrystal systems. We also discuss limitations and future outlook of this technique.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Chemical Society. |
| Keywords: | quantum dot; Heterostructured nanocrystal; Internal Istructure; X-ray photoelectron spectroscopy; Gradient alloy; Luminescence. |
| ID Code: | 142132 |
| Deposited On: | 11 Jan 2026 05:48 |
| Last Modified: | 11 Jan 2026 05:48 |
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