Shear-wave time of flight diffraction (S-TOFD) technique

Abstract

Ultrasonic time of flight diffraction (TOFD) for sizing defects is based on the time of flight of the diffracted echo that is generated when a longitudinal wave is incident on a crack tip. This technique has the limitation during near-surface inspection due to signal superposition. Here, this limitation is overcome by using the shear wave-diffracted signal (instead of longitudinal wave) and hence called S-TOFD. Experiments were conducted on samples with defect tip closer to the surface of a flat plate sample to illustrate the utility of the S-TOFD technique. An increase in the flaw sizing accuracy, by using the shear wave-diffracted echoes from the tip and through the application of a signal processing technique (ESIT), was demonstrated.