Four-exposure hologram Moire interferometry and speckle-pattern interferometry: a comparison

Hariharan, P. ; Hegedus, Z. S. (1975) Four-exposure hologram Moire interferometry and speckle-pattern interferometry: a comparison Applied Optics, 14 (1). pp. 22-23. ISSN 0003-6935

Full text not available from this repository.

Official URL: http://www.opticsinfobase.org/ao/abstract.cfm?URI=...

Related URL: http://dx.doi.org/10.1364/AO.14.000022

Abstract

This article does not have an abstract.

Item Type:Article
Source:Copyright of this article belongs to Optical Society of America.
ID Code:13951
Deposited On:12 Nov 2010 14:25
Last Modified:03 Jun 2011 07:13

Repository Staff Only: item control page