Sastry, Murali ; Ganguly, P. ; Badrinarayanan, S. ; Mandale, A. B. ; Sainkar, S. R. ; Paranjape, D. V. ; Patil, K. R. ; Chaudhary, S. K. (1991) Attenuation length measurements in lead arachidate Langmuir Blodgett films Journal of Applied Physics, 70 (11). pp. 7073-7077. ISSN 0021-8979
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Official URL: http://jap.aip.org/resource/1/japiau/v70/i11/p7073...
Related URL: http://dx.doi.org/10.1063/1.349788
Abstract
In this paper the attenuation length measurements in lead arachidate [(C19H39COO)2Pb] Langmuir Blodgett films deposited on copper was reported on. A discrete layer model appropriate to the ordered structure of these built up films is applied to the measurements of the x-ray photoemission intensity variation with electron takeoff angle and attenuation lengths for Pb 4f7/2, O 1s and Cu 2p3/2 electrons (kinetic energy range 550-1350 eV) are determined. There is evidence for the dependence of the attenuation length on the dielectric properties of the film/substrate interface through a variation of the film thickness.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| Keywords: | Langmuir-blodgett Films; Photoemission; Attenuation; Angular Distribution; Interface Structure; Thickness |
| ID Code: | 13848 |
| Deposited On: | 12 Nov 2010 14:36 |
| Last Modified: | 31 May 2011 09:49 |
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