Kajen, R. S. ; Chandrasekhar, N. ; Pey, K. L. ; Vijila, C. ; Jaiswal, M. ; Saravanan, S. ; Ng, A. M. H. ; Wong, C. P. ; Loh, K. P. (2012) Trap Levels in Graphene Oxide: A Thermally Stimulated Current Study ECS Solid State Letters, 2 (2). M17-M19. ISSN 2162-8742
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Official URL: http://doi.org/10.1149/2.006302ssl
Related URL: http://dx.doi.org/10.1149/2.006302ssl
Abstract
We report thermally stimulated current (TSC) experiments on graphene oxide (GO) to study the effects of various defect levels near the GO Fermi level. The TSC peaks are ascribed to detrapping from defect levels to the GO hopping transport energy level, and are found to be in agreement with the GO density of states reported in the literature. This work will be useful in evaluating the use of GO in memory/dielectric/barrier applications.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to IOP Publishing. |
| ID Code: | 130298 |
| Deposited On: | 24 Nov 2022 05:56 |
| Last Modified: | 24 Nov 2022 05:56 |
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