Hazra, Aritra ; Ghosh, Priyankar ; Vadlamudi, S. G. ; Chakrabarti, P. P. ; Dasgupta, Pallab (2013) Formal Methods for Early Analysis of Functional Reliability in Component-Based Embedded Applications IEEE Embedded Systems Letters, 5 (1). pp. 8-11. ISSN 1943-0663
Full text not available from this repository.
Official URL: http://doi.org/10.1109/LES.2013.2239605
Related URL: http://dx.doi.org/10.1109/LES.2013.2239605
Abstract
We present formal methods for determining whether a set of components with given reliability certificates for specific functional properties are adequate to guarantee desired end-to-end properties with specified reliability requirements. We introduce a formal notion for the reliability gap in component-based designs and demonstrate the proposed approach for analyzing this gap using a case study developed around an Elevator Control System.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to IEEE |
| ID Code: | 129753 |
| Deposited On: | 21 Nov 2022 03:49 |
| Last Modified: | 21 Nov 2022 03:49 |
Repository Staff Only: item control page
