Blum, Ivan D. ; Isheim, Dieter ; Seidman, David N. ; He, Jiaqing ; Androulakis, John ; Biswas, Kanishka ; Dravid, Vinayak P. ; Kanatzidis, Mercouri G. (2012) Dopant Distributions in PbTe-Based Thermoelectric Materials Journal of Electronic Materials, 41 (6). pp. 1583-1588. ISSN 0361-5235
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Official URL: http://doi.org/10.1007/s11664-012-1972-2
Related URL: http://dx.doi.org/10.1007/s11664-012-1972-2
Abstract
Atom-probe tomography (APT) is utilized to characterize the dopant distribution in two thermoelectric materials systems: (1) PbTe-2 mol.%SrTe-1 mol.%Na2Te, and (2) codoped PbTe-1.25 mol.%K-1.4 mol.%Na. We observe the presence of Na-rich precipitates of a few nanometers in diameter in both systems. Both concentration frequency distribution analyses and partial radial distribution functions are employed to analyze the tendency for dopant clustering detected by APT. In the codoped sample, K accumulates significantly in Na-rich precipitates, while in the Sr-containing sample, Sr is homogeneously distributed. High-resolution transmission electron microscopy also reveals the presence of precipitates having platelet morphology, which are oriented parallel to the {001} planes.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Springer Nature |
| Keywords: | PbTe, Na, K, precipitates, atom-probe tomography |
| ID Code: | 128173 |
| Deposited On: | 03 Nov 2022 05:49 |
| Last Modified: | 03 Nov 2022 05:49 |
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