Hariharan, Parameswaran (2002) Phase-shifting interferometry: measurements with high-reflectance surfaces Optical Engineering, 41 (4). pp. 856-859. ISSN 0091-3286
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Official URL: http://link.aip.org/link/?OPEGAR/41/856/1
Related URL: http://dx.doi.org/10.1117/1.1457461
Abstract
With a phase-shifting Fizeau interferometer, problems arise in making accurate measurements of nominally flat optical surfaces with high-reflectance coatings. We describe a simple technique that can be used to make accurate measurements of such surfaces.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to International Society for Optical Engineering. |
| ID Code: | 12591 |
| Deposited On: | 12 Nov 2010 15:42 |
| Last Modified: | 12 Nov 2010 15:42 |
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