Hariharan, P. ; Hegedus, Z. S. (1974) Measurement of symmetrical and anti-symmetrical deformations by hologram interferometry Optics Communications, 11 (2). pp. 127-131. ISSN 0030-4018
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Official URL: http://linkinghub.elsevier.com/retrieve/pii/003040...
Related URL: http://dx.doi.org/10.1016/0030-4018(74)90199-0
Abstract
It is often difficult to distinguish between undesired movements of a specimen and the surface displacements under study in experimental hologram interferometry. A simple technique is described, applicable to specimens which should exhibit only symmetrical deflections, which permits measurements from a single hologram of the symmetrical components of the deformations of the two opposite faces of the specimen, as well as the anti-symmetrical components corresponding to shifts or tilts of its plane of symmetry.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Elsevier Science. |
| ID Code: | 12578 |
| Deposited On: | 12 Nov 2010 15:44 |
| Last Modified: | 03 Jun 2011 07:13 |
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