Sen, Kornikar ; Srivastava, Chirag ; Mal, Shiladitya ; Sen(De), Aditi ; Sen, Ujjwal (2021) Detection loophole in measurement-device-independent entanglement witnesses Physical Review A, 103 (3). ISSN 0031-899X (print); 1536-6065 (web)
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Official URL: https://doi.org/10.1103%2Fphysreva.103.032415
Abstract
There always exists an entanglement witness for every entangled quantum state. Negativity of the expectation value of an entanglement witness operator guarantees entanglement of the corresponding state, given that the measurement devices involved are perfect, i.e., the performed measurements actually constitute the witness operator for the state under consideration. In a realistic situation, there are two possible ways of measurements to drive the process away from the ideal one. Firstly, wrong measurements may be performed, and secondly, while the measurement operators are implemented correctly, the detection process is noisy. Entanglement witnesses are prone to both of these imperfections. The concept of measurement-device-independent entanglement witnesses was introduced to remove the first problem. We analyze the "detection loophole" in the context of measurement-device-independent entanglement witnesses, which deal with the second problem of imprecise measurements. We obtain an upper bound on the entanglement witness function in the measurement-device-independent entanglement witness scenario, below which entanglement is guaranteed for given non-ideal detector efficiencies, that can involve both lost events and dark counts.
Item Type: | Article |
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ID Code: | 125696 |
Deposited On: | 12 Oct 2022 08:40 |
Last Modified: | 12 Oct 2022 08:40 |
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