Orloff, Jon ; Narayana, Chandrabhas ; Ruoff, Arthur L. (2000) Use of focused ion beams for making tiny sample holes in gaskets for diamond anvil cells Review of Scientific Instruments, 71 (1). pp. 216-219. ISSN 0034-6748
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Official URL: https://aip.scitation.org/doi/abs/10.1063/1.115018...
Related URL: http://dx.doi.org/10.1063/1.1150185
Abstract
To achieve multimegabar pressures in the diamond anvil cell, small diamond tips, 20 μm (or less) in diameter and high strength gasket materials are required. To prevent plastic instability it is therefore necessary to drill sample holes with diameters of 10 μm (or less) in extremely strong and tough materials such as tungsten. The present paper describes a technique for drilling such holes using focused ion beams. The superior roundness and surface finish of these holes is one of the reasons our group was able to reach pressures of 342 GPa on hydrogen, significantly higher than that reached by other researchers.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 113542 |
| Deposited On: | 23 Apr 2018 12:12 |
| Last Modified: | 23 Apr 2018 12:12 |
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