Sundaresan, A. ; Gopinath, C. S. ; Tamhane, A. S. ; Rajarajan, A. K. ; Sharon, M. ; Subramanian, S. ; Pinto, R. ; Gupta, L. C. ; Vijayaraghavan, R. (1992) X-ray photoelectron spectroscopic studies of the valence state of Tl in single-Tl-O-layered TlBa1-xSrxLaCuO5 (0≤x≤1) Physical Review B, 46 (10). pp. 6622-6625. ISSN 0163-1829
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Official URL: http://prb.aps.org/abstract/PRB/v46/i10/p6622_1
Related URL: http://dx.doi.org/10.1103/PhysRevB.46.6622
Abstract
The valence state of thallium in TlBa1-xSrxLaCuO5 (x=0.0, 0.4, 0.7, and 1.0) has been investigated by measuring Tl 4f core levels by x-ray photoelectron spectroscopy. It is shown that the valence state of Tl in TlBaLaCuO5 (nonsuperconducting) is 3+, whereas that in TlSrLaCuO5 (superconducting, Tc=32 K) is between 3+ and 1+. The origin of holes in the latter compound is discussed in terms of charge transfer between Tl ions and Cu-O layers as has been found in double-Tl-O-layered compounds.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Physical Society. |
| ID Code: | 11327 |
| Deposited On: | 09 Nov 2010 03:33 |
| Last Modified: | 23 Feb 2012 11:33 |
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