Islam, A. E. ; Kumar, E. N. ; Das, H. ; Purawat, S. ; Maheta, V. ; Aono, H. ; Murakami, E. ; Mahapatra, S. ; Alam, M. A. (2007) Theory and practice of on-the-fly and ultra-fast VT measurements for NBTI degradation: Challenges and opportunities In: 2007 IEEE International Electron Devices Meeting, IEDM, 10-12 Dec, 2007, Washington, DC, USA.
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Official URL: http://ieeexplore.ieee.org/abstract/document/44190...
Related URL: http://dx.doi.org/10.1109/IEDM.2007.4419070
Abstract
On-the-fly and ultra-fast VT are popular characterization techniques for analyzing NBTI degradation. We show that these techniques do not probe the intrinsic NBTI degradation directly and hence require suitable correction. The 'corrected' data allows us to explore the subtlety of relaxation dynamics by various measurements and suggest a theoretical basis for log-t relaxation consistent within R-D framework.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Source: | Copyright of this article belongs to Institute of Electrical and Electronics Engineers. |
| ID Code: | 112606 |
| Deposited On: | 12 Apr 2018 07:22 |
| Last Modified: | 12 Apr 2018 07:22 |
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