Magnetic studies of ion beam irradiated Co/CoO thin films

Bhattacharyya, A. S. ; Kabiraj, D. ; Yusuf, S. M. ; Dev, B. N. (2014) Magnetic studies of ion beam irradiated Co/CoO thin films Physics Procedia, 54 . pp. 87-89. ISSN 1875-3892

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Official URL: http://www.sciencedirect.com/science/article/pii/S...

Related URL: http://dx.doi.org/10.1016/j.phpro.2014.10.041

Abstract

Ion beam irradiation was performed on Co/CoO films deposited on Si (111) substrates by magnetron sputtering. Ion-beam-induced dewetting was observed. Dewetting is due to larger surface free energy of Co compared to CoO. Magnetic studies performed by SQUID and PPMS, showed exchange bias at the Co/CoO interface which forms a FM/AFM system.

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
Keywords:Ion Beam; Co/CoO Thin Films; Dewetting; Exchange Bias
ID Code:111994
Deposited On:01 Dec 2017 12:07
Last Modified:01 Dec 2017 12:07

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