Patwe, S. J. ; Achary, S. Nagabhusan ; Tyagi, Avesh K. (2009) Crystal structure, electrical, and thermal properties of Ca0.5Th0.5VO4 Journal of the Materials Research, 24 (12). pp. 3551-3558. ISSN 0884-2914
Full text not available from this repository.
Official URL: https://www.cambridge.org/core/journals/journal-of...
Related URL: http://dx.doi.org/10.1557/jmr.2009.0449
Abstract
Ca0.5Th0.5VO4 was prepared by a solid-state reaction of component oxides and characterized by powder x-ray diffraction (XRD) at ambient and higher temperatures and impedance spectroscopy. Crystal structure was refined by Rietveld refinements from powder XRD data. At room temperature, Ca0.5Th0.5VO4 has a zircon-type tetragonal (I41/amd) lattice with unit cell parameters: a = 7.2650(1) and c = 6.4460(1) Å. Despite the large charge difference, Ca2+ and Th4+ are statistically distributed over a single site. The crystal structure of Ca0.5Th0.5VO4 is built from the (Ca/Th)O8 (bisdisphenoid) and VO4 tetrahedra. The in situ high-temperature XRD studies on Ca0.5Th0.5VO4 revealed anisotropic thermal expansion behavior with coefficients of thermal expansion αc = 10.96 × 10−6/°C and αa = 5.32 × 10−6/°C. The impedance measurements carried out in the temperature range from ambient to 800 °C indicate semiconducting behavior with appreciable ionic conductivity above 400 °C. The activation energy obtained from the temperature-dependent AC conductivity data is ∼1.37 eV. In wider range of frequencies and temperatures, the relative permittivity of approximately 50 to 60 is observed for Ca0.5Th0.5VO4.
Item Type: | Article |
---|---|
Source: | Copyright of this article belongs to Cambridge University Press. |
Keywords: | Crystallographic Structure; X-Ray Diffraction (XRD); Dielectric Properties |
ID Code: | 108133 |
Deposited On: | 01 Feb 2018 11:31 |
Last Modified: | 01 Feb 2018 11:31 |
Repository Staff Only: item control page