Nanocrystal superlattice imaging by atomic force microscopy

Stoimenov, Peter K. ; Stoeva, Savka I. ; Prasad, B. L .V. ; Sorensen, Christopher M. ; Klabunde, Kenneth J. (2004) Nanocrystal superlattice imaging by atomic force microscopy In: Proceedings of SPIE, Bellingham, WA.

Full text not available from this repository.

Official URL: http://proceedings.spiedigitallibrary.org/article....

Related URL: http://dx.doi.org/10.1117/12.558429

Abstract

Applicability of Atomic Force Microscopy (AFM) for structural characterization of nanocrystal superlattices is demonstrated on high-resolution imaging of superlattices formed by thiol stabilized gold nanoparticles on carbon coated and hydrophobic supports. Thin (<1 nm) uniform coating of the samples with metal film before imaging was found to eliminate the undesirable effects of tip-sample interaction. Size and interparticle spacing are in excellent agreement with transmission electron microscopy results. AFM can be used as a complementary technique for nanocrystal superlattice structural characterization providing possibilities for crystal growth investigation on a variety of supports of practical interest and high resolution of the surface structure of superlattice structures.

Item Type:Conference or Workshop Item (Paper)
Source:Copyright of this article belongs to Proceedings of SPIE.
ID Code:105347
Deposited On:01 Feb 2018 17:11
Last Modified:01 Feb 2018 17:11

Repository Staff Only: item control page