Nanocrystal superlattice imaging by atomic force microscopy

Abstract

Applicability of Atomic Force Microscopy (AFM) for structural characterization of nanocrystal superlattices is demonstrated on high-resolution imaging of superlattices formed by thiol stabilized gold nanoparticles on carbon coated and hydrophobic supports. Thin (<1 nm) uniform coating of the samples with metal film before imaging was found to eliminate the undesirable effects of tip-sample interaction. Size and interparticle spacing are in excellent agreement with transmission electron microscopy results. AFM can be used as a complementary technique for nanocrystal superlattice structural characterization providing possibilities for crystal growth investigation on a variety of supports of practical interest and high resolution of the surface structure of superlattice structures.