Ravishankar, N. (2010) Seeing is believing: electron microscopy for investigating nanostructures The Journal of Physical Chemistry Letters, 1 (8). pp. 1212-1220. ISSN 1948-7185
Full text not available from this repository.
Official URL: http://pubs.acs.org/doi/abs/10.1021/jz100163x
Related URL: http://dx.doi.org/10.1021/jz100163x
Abstract
Controlling the properties of nanostructures requires a detailed understanding of structure, microstructure, and chemistry at ever-decreasing length scales. The modern day transmission electron microscope has thus become an indispensable tool in the study of nanostructures. In this Perspective, we present a brief account of the capabilities of the TEM with some typical examples for characterizing nanostructures. The modern-day TEM has moved from a simple characterization tool to a nanoscale laboratory enabling in situ observation of several fundamental processes at unprecedented resolution levels.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Chemical Society. |
| ID Code: | 105084 |
| Deposited On: | 01 Feb 2018 16:35 |
| Last Modified: | 01 Feb 2018 16:35 |
Repository Staff Only: item control page
