Basu, J. ; Divakar, R. ; Ravishankar, N. ; Carter, C. B. (2008) Complementary microscopy techniques for characterizing nanostructures Microscopy and Microanalysis, 14 (S2). pp. 374-375. ISSN 1431-9276
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Official URL: https://www.cambridge.org/core/journals/microscopy...
Related URL: http://dx.doi.org/10.1017/S1431927608086753
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Cambridge University Press. |
| ID Code: | 104991 |
| Deposited On: | 01 Feb 2018 16:31 |
| Last Modified: | 01 Feb 2018 16:31 |
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