Riesterer, J. L. ; Farrer, J. K. ; Ravishankar, N. ; Carter, C. B. (2006) Studying trapped grains in alumina using SEM and EBSD Microscopy and Microanalysis, 12 (S02). pp. 1020-1021. ISSN 1431-9276
Full text not available from this repository.
Official URL: https://www.cambridge.org/core/journals/microscopy...
Related URL: http://dx.doi.org/10.1017/S1431927606063069
Abstract
Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Cambridge University Press. |
| ID Code: | 104965 |
| Deposited On: | 01 Feb 2018 15:21 |
| Last Modified: | 01 Feb 2018 15:21 |
Repository Staff Only: item control page
