Farrer, Jeffrey K. ; Carter, C. Barry ; Ravishankar, N. (2006) The effects of crystallography on grain-boundary migration in alumina Journal of Materials Science, 41 (3). pp. 661-674. ISSN 0022-2461
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Official URL: http://link.springer.com/article/10.1007/s10853-00...
Related URL: http://dx.doi.org/10.1007/s10853-006-6482-2
Abstract
The sintering process of ceramics involves mass transport across grain boundaries resulting in the migration of these boundaries. When there is a liquid at the interface—as in liquid-phase sintering—the mass transport can be enhanced. In this study, electron backscatter diffraction has been used to examine grain-boundary migration of controlled interfaces in alumina. The interfaces were prepared by hot pressing single-crystal and polycrystalline alumina to single-crystal alumina substrates of known orientation. EBSD patterns, taken near the sintered interfaces, have been used to study the effects of crystallography on migration direction and rate.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Springer-Verlag. |
| ID Code: | 104886 |
| Deposited On: | 01 Feb 2018 15:21 |
| Last Modified: | 01 Feb 2018 15:21 |
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