On the influence of applied fields on spinel formation

Korte, C. ; Farrer, J. K. ; Ravishankar, N. ; Michael, J. R. ; Schmalzried, H. ; Carter, C. B. (1999) On the influence of applied fields on spinel formation MRS Online Proceedings Library, 586 . pp. 151-156. ISSN 1946-4274

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Official URL: https://www.cambridge.org/core/journals/mrs-online...

Related URL: http://dx.doi.org/10.1557/PROC-586-151


Interfaces play an important role in determining the effect of electric fields on the mechanism of the formation of spinel by solid-state reaction. The reaction occurs by the movement of phase boundaries but the rate of this movement can be affected by grain boundaries in the reactants or in the reaction product. Only by understanding these relationships will it be possible to engineer their behavior. As a particular example of such a study, Mgln2O4 can be formed by the reaction between single-crystal MgO substrate and a thin film of In2O3 with or without an applied electric field. High-resolution backscattered electron (BSE) imaging and electron backscattered diffraction (EBSD) in a scanning electron microscope (SEM) has been used to obtain complementary chemical and crystallographic information.

Item Type:Article
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ID Code:104670
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