Sharma, R. B. ; Vinod, C. P. ; Kulkarni, G. U. (2002) A method employing STM for the estimation of relative changes in the work function of modified metal tips Bulletin of Materials Science, 25 (3). pp. 247-249. ISSN 0250-4707
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Official URL: http://link.springer.com/article/10.1007/BF0271116...
Related URL: http://dx.doi.org/10.1007/BF02711162
Abstract
I-z spectroscopy measurements using a scanning tunnelling microscope (STM) were carried out to determine the change in the work function of a W tip following one monolayer (1 ML) deposition of Ni and subsequent annealing at 700 K. The variation in the actual gap voltage obtained from the I-z data of the clean tip was used in the calculation. The estimated values of the change in work function, 016 eV and 0.59 eV, for as-deposited and annealed tips, respectively match closely with the reported values. The method is generally applicable to chemically modified metal tips.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Indian Academy of Sciences. |
| Keywords: | I-z Spectroscopy; Scanning Tunneling Microscope; Workfunction |
| ID Code: | 103207 |
| Deposited On: | 17 Feb 2017 07:39 |
| Last Modified: | 17 Feb 2017 07:39 |
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