Shape- and size-dependent electronic capacitance in nanostructured materials

Abstract

The shape and size are the two important geometrical factors that affect the electronic screening in nano-materials. Here, we develop an analytical theory for electronic capacitance based on Thomas–Fermi screening in conjunction with ‘multiple scattering method’ for arbitrary-shaped nanostructures including electronic spillover correction. We relate the electronic capacitance of the material to the curvature correction expressed in terms of ratio of electronic screening length to principal radii of curvature. Electronic capacitance of various nanostructures is obtained showing geometrical shape- and size-dependent electronic screening in nanostructures that manifest important consequences in charge storage enhancement or reduction.