Chandni, U. ; Ghosh, Arindam ; Vijaya, H. S. ; Mohan, S. (2008) Signature of martensite transformation on conductivity noise in thin films of NiTi shape memory alloys Applied Physics Letters, 92 (11). Article ID 112110. ISSN 0003-6951
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Official URL: http://scitation.aip.org/content/aip/journal/apl/9...
Related URL: http://dx.doi.org/10.1063/1.2896304
Abstract
Slow time-dependent fluctuations, or noise, in the electrical resistance of dc magnetron sputtered thin films of nickel-titanium shape memoryalloys have been measured. Even in equilibrium, the noise was several orders of magnitude larger than that in simple diffusive metallic films and was found to be nonmonotonic around the martensitic transformation regime. The results are discussed in terms of the dynamics of structuraldefects, which also lay the foundation to a new noise-based characterization scheme of martensite transformation.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Institute of Physics. |
| ID Code: | 101560 |
| Deposited On: | 01 Feb 2018 10:07 |
| Last Modified: | 01 Feb 2018 10:07 |
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