Ghatak, Subhamoy ; Pal, Atindra Nath ; Ghosh, Arindam (2011) Nature of electronic states in atomically thin MoS2 field-effect transistors ACS Nano, 5 (10). pp. 7707-7712. ISSN 1936-0851
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Official URL: http://pubs.acs.org/doi/abs/10.1021/nn202852j
Related URL: http://dx.doi.org/10.1021/nn202852j
Abstract
We present low-temperature electrical transport experiments in five field-effect transistor devices consisting of monolayer, bilayer and trilayer MoS2 films, mechanically exfoliated onto Si/SiO2 substrate. Our experiments reveal that the electronic states in all films are localized well up to room temperature over the experimentally accessible range of gate voltage. This manifests in two-dimensional (2D) Variable Range Hopping (VRH) at high temperatures, while below ∼30 K, the conductivity displays oscillatory structures in gate voltage arising from resonant tunneling at the localized sites. From the correlation energy (T0) of VRH and gate voltage dependence of conductivity, we suggest that Coulomb potential from trapped charges in the substrate is the dominant source of disorder in MoS2 field-effect devices, which leads to carrier localization, as well.
Item Type: | Article |
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Source: | Copyright of this article belongs to American Chemical Society. |
Keywords: | Charge Impurity Scattering; Dichalcogenides; Field-Effect Transistor; Localization; MoS2; Mott Variable Range Hopping; Resonant Tunneling |
ID Code: | 101542 |
Deposited On: | 01 Feb 2018 10:06 |
Last Modified: | 01 Feb 2018 10:06 |
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