Bysakh, Sandip ; Das, Puspendu Kumar ; Chattopadhyay, Kamanio (2002) Microstructure evolution and metastable phase formation in laser-ablation-deposited films of Ti5Si3 intermetallic compound Philosophical Magazine Part A, 82 (6). pp. 1235-1248. ISSN 0141-8610
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Related URL: http://dx.doi.org/10.1080/01418610208240028
Abstract
Thin films of Ti62.5Si37.5 composition were deposited by the pulsed-laser ablation technique on single-crystal Nad substrates at room temperature and on 'single-crystal' superalloy substrates at elevated temperatures. Both vapour and liquid droplets generated by pulsed-laser ablation of the target become quenched on the substrate. Amorphization had taken place in the process of quenching of vapour-plasma as well as small liquid droplets on NaCl substrates at room temperature. In addition to the formation of Ti5Si3, a metastable fcc phase (a0 = 0.433 nm) also forms in micron-sized large droplets as well as in the medium-sized submicron droplets. The same metastable fcc phase nucleates during deposition from the vapour state at 500°C and at 600°C on a superalloy substrate as well as during crystallization of the amorphous phase. The evolution of the metastable fcc phase in the Ti-Si system during non-equilibrium processing is reported for the first time.
Item Type: | Article |
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Source: | Copyright of this article belongs to Taylor and Francis Ltd. |
ID Code: | 10111 |
Deposited On: | 02 Nov 2010 10:00 |
Last Modified: | 10 Feb 2011 09:53 |
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