Self-assembled ge nanostructures on polymer-coated silicon: growth and characterization

Das, Amal K. ; Kamila, J. ; Dev, B. N. ; Sundaravel, B. ; Kuri, G. (2000) Self-assembled ge nanostructures on polymer-coated silicon: growth and characterization Applied Physics Letters, 77 (7). pp. 951-953. ISSN 0003-6951

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Official URL: http://apl.aip.org/resource/1/applab/v77/i7/p951_s...

Related URL: http://dx.doi.org/10.1063/1.1288599

Abstract

Self-assembled Ge nanoparticles have been grown on polymer-coated Si substrates by thermal evaporation under high vacuum utilizing the nonwetting condition given by the surface free-energy relation σ Ge»σpolymer. The nanostructures have been characterized by Raman spectroscopy, atomic-force microscopy (AFM), and optical microscopy. Raman spectrum shows a prominent Ge-Ge vibration peak at 302cm-1. AFM and optical microscopy show the formation of isolated Ge islands (>~100nm base, <~25nm height), nanowires (160 nm base, 25 nm height), and islands in linear chains. The possibility of embedding such nanostructures in waveguide structures are discussed.

Item Type:Article
Source:Copyright of this article belongs to American Institute of Physics.
Keywords:Germanium; Nanostructured Materials; Vacuum Deposition; Elemental Semiconductors; Self-assembly; Surface Energy; Raman Spectra; Atomic Force Microscopy; Optical Microscopy; Island Structure; Semiconductor Growth
ID Code:10077
Deposited On:02 Nov 2010 09:52
Last Modified:16 May 2016 19:45

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