Dev, B. N. ; Das, Amal K. ; Dev, S. ; Schubert, D. W. ; Stamm, M. ; Materlik, G. (2000) Resonance enhancement of x rays in layered materials: application to surface enrichment in polymer blends Physical Review B, 61 (12). pp. 8462-8468. ISSN 0163-1829
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Official URL: http://prb.aps.org/abstract/PRB/v61/i12/p8462_1
Related URL: http://dx.doi.org/10.1103/PhysRevB.61.8462
Abstract
Resonance enhancement of x rays of both odd and even orders has been observed in a thin polymer blend film of polystyrene (PS) and polybromostyrene (PBrxS) spin cast on a smooth Au layer on a silicon substrate. The x-ray intensity enhancement has been measured by detecting fluorescence from the Br atoms in the PBrxS component of the compatible polymer blend. Analysis of the Br Kα fluorescence has yielded the PBrxS distribution in the polymer blend layer in agreement with a PS surface enrichment model. PS is largely enriched at the free surface of the polymer layer and partially enriched at the underlying interface.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to American Physical Society. |
| ID Code: | 10025 |
| Deposited On: | 02 Nov 2010 10:06 |
| Last Modified: | 30 May 2011 05:57 |
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