Short time Fourier transform analysis for understanding frequency dependent attenuation in austenitic stainless steel

Sharma, Govind K. ; Kumar, Anish ; Rao, Babu C. ; Jayakumar, T. ; Raj, Baldev (2013) Short time Fourier transform analysis for understanding frequency dependent attenuation in austenitic stainless steel NDT & E International, 53 . pp. 1-7. ISSN 0963-8695

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Official URL: http://www.sciencedirect.com/science/article/pii/S...

Related URL: http://dx.doi.org/10.1016/j.ndteint.2012.09.001

Abstract

Short time Fourier transform (STFT) has been used to study the distribution of ultrasonic energy as a function of the frequency of the wave in the backscatter and the back-wall echoes obtained from austenitic stainless steel specimens with different grain sizes in a range of 30–210 μm. A 25 MHz nominal frequency immersion transducer was used in pulse-echo mode for data acquisition. In specimens with larger grain sizes (>100 μm), the frequency content of the first back-wall echo was 4.5–7.0 MHz only whereas the predominant frequency of the backscatter was in a range of 15–25 MHz up to the third/fourth back-wall echo. The amplitude and the frequency content of the back-wall echoes decreased rapidly with the propagation distance, however those of the backscatter decreased very slowly indicating high scattering and low absorption rates in the austenitic stainless steel specimens. The decrease in the center frequency of the first, second and third back-wall echoes has been correlated with the average grain size. The study demonstrates the usefulness of STFT in analyzing the frequency content of the backscatter and back-wall echoes simultaneously and thus understanding the frequency dependent attenuation in high scattering materials for microstructural characterization applications.

Item Type:Article
Source:Copyright of this article belongs to Elsevier Science.
Keywords:Ultrasonic Scattering; Grain Size; Short Time Fourier transform (STFT); Austenitic Stainless Steel
ID Code:97685
Deposited On:23 May 2013 06:20
Last Modified:02 Feb 2023 06:47

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