A critical analysis of the shear difference method

Srinath, L. S. ; Keshavan, S. Y. (1975) A critical analysis of the shear difference method Journal of Physics D: Applied Physics, 8 (5). p. 463. ISSN 0022-3727

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Official URL: http://iopscience.iop.org/0022-3727/8/5/006

Related URL: http://dx.doi.org/10.1088/0022-3727/8/5/006


The shear difference method which is commonly used for the separation of normal stresses using photoelastic techniques depends on the step-by-step integration of one of the differential equations of equilibrium. It is assumed that the isoclinic and the isochromatic parameters measured by the conventional methods pertain to the state of stress at the midpoint of the light path. In practice, a slice thin enough for the above assumption to be true and at the same time thick enough to give differences in the shear-stress values over the thickness is necessary. The paper discusses the errors introduced in the isoclinic and isochromatic values by the conventional methods neglecting the variation of stresses along the light path. It is shown that while the error introduced in the measurement of the isochromatic parameter may not be serious, the error caused in the isoclinic measurement may lead to serious errors. Since the shear-difference method involves step-by-step integration the error introduced will be of a cumulative nature.

Item Type:Article
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