Effect of pressure on the emf of solid-state cells

Jacob, K. T. ; Iwase, M. (1983) Effect of pressure on the emf of solid-state cells High temperature science, 16 (2). pp. 123-129. ISSN 0018-1536

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Abstract

The effect of pressure on the emf of solid-state galvanic cells: PtNi+NiOZrO2(CaO)Cu+Cu2PPt (I); Pt"FeO"+ Fe3O4ZrO2(CaO)Fe3O4 + Fe2O3Pt (II); were measured in the pressure range 1.01x105 to 8.08 x 108 Pa. Within experimental error, the emf was found to vary linearly with pressure: EI (1000 K)mV = 275.5 + 2.62 x 10-8((PPa) - 101,325); EII/ (896 K)mV = 442.5 - 2.45 x 10 -8((PPa) - 101,325). These results are consistent with available data on entropy and volume changes associated with cell reactions.

Item Type:Article
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ID Code:94800
Deposited On:17 Oct 2012 10:40
Last Modified:17 Oct 2012 10:40

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