Saxena, A. ; Lookman, T. ; Shenoy, S. R. ; Bishop, A. R. (2000) Defect-induced microstructure and shape memory in a continuum model Materials Science Forum, 327-328 . pp. 385-388. ISSN 0255-5476
Full text not available from this repository.
Official URL: http://www.scientific.net/MSF.327-328.385
Related URL: http://dx.doi.org/10.4028/www.scientific.net/MSF.327-328.385
Abstract
This article does not have an abstract.
| Item Type: | Article |
|---|---|
| Source: | Copyright of this article belongs to Trans Tech Publications Inc. |
| ID Code: | 92820 |
| Deposited On: | 05 Jun 2012 10:18 |
| Last Modified: | 05 Jun 2012 10:18 |
Repository Staff Only: item control page
