Integrated analysis of topographically high Mafic exposures at Apollo-17 landing site using data from imaging sensors of Chandrayaan-1

Chauhan, P. ; Srivastava, N. ; Pieters, C. M. ; AjaI, ; Kiran Kumar, A. S. ; Navalgund, R. R. ; Head, J. W. ; Petro, N. ; Runyon, C. ; Goswami, J. N. (2010) Integrated analysis of topographically high Mafic exposures at Apollo-17 landing site using data from imaging sensors of Chandrayaan-1 41st Lunar and Planetary Science Conference . No pp. given.

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Official URL: http://www.lpi.usra.edu/meetings/lpsc2010/

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Item Type:	Article
Source:	Copyright of this article belongs to Lunar and Planetary Institute.
ID Code:	89362
Deposited On:	26 Apr 2012 13:16
Last Modified:	19 May 2016 03:56

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